Micro-bunching of the Ags Slow Extracted Beam for a Rare Kaon Decay Search

The AGS Slow Extracted Beam (SEB) must be chopped with 250 ps bursts every 40 ns to permit time-of-flight (ToF) measurement of the secondary K 0 beam. Standard techniques to produce this level of bunching would require excessive rf voltage, thus we have developed a “MicroBunching” technique of extracting the beam as it is forced between empty rf buckets. A specification of the required rf system will be given. Four-dimensional model simulations of particle dynamics for the planned rf and extrac-tion systems will be shown. Simulations of previous tests along with the test measurements are also presented. Measurement of tight bunching requires dedicated instrumentation. The design of a detector system to measure bunch widths and the extinction factor between bunches will be given; considerations include the various particles produced and transported, timing precision and background.